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http://nopr.niscpr.res.in/handle/123456789/44805| Title: | Measuring Dynamic Operation Efficiency for Universal Top 10 TFT-LCDs by Improved Data Envelopment Analysis |
| Authors: | Lee, ZY Lin, Grace T R Lee, S J |
| Keywords: | Thin Film Transistor-Liquid Crystal Display (TFT-LCD);Improved Data Envelopment Analysis (DEA);Operation Efficiency;Window Analysis |
| Issue Date: | Aug-2018 |
| Publisher: | NISCAIR-CSIR, India |
| Abstract: | Currently the major manufacturers of TFT-LCD (Thin Film Transistor-Liquid Crystal Display) in South Korea, Taiwan and Japan and contribute 80% sales in global market. In view of the rapid growth of global demand, TFT-LCD manufacturers face tremendous competition. In this context, how to configure the best resource allocation and create more profit tend to be the major issue. In this study, the TFT-LCD firms in China, Korea and Japan is analyzed. Based on the trend analysis by Industrial Technology Research Institute in Taiwan, public database and information, financial statements and annual reports of these firms, we use improved Data Envelopment Analysis (DEA) in association with Window Analysis to measure their dynamic operating performance in China, Korea and Japan. |
| Page(s): | 447-450 |
| ISSN: | 0975-1084 (Online); 0022-4456 (Print) |
| Appears in Collections: | JSIR Vol.77(08) [August 2018] |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| JSIR 77(8) 447-450.pdf | 283.88 kB | Adobe PDF | View/Open |
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