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|Title:||Dielectric properties of TixLi1-xLa0.1Fe1.9O4 ferrite thin films|
|Authors:||Abdelmoneim, H M|
|Abstract:||The variation of dielectric constant (ε'), dielectric loss factor (ε") and the ac conductivity (σac) of mixed TixLi1-xLa0.1Fe1.9O4 (where x = 0.1, 0.3, 0.5, 0.7 and 0.9) ferrite thin films has been studied as a function of both frequency and temperature. The variation of dielectric constant with different temperature in all films gives a broad peak. The maximum peak is almost fixed at 500 K independent of lithium content. The ε'(f) and ε"( f ) curves at different temperatures for all samples show a higher dispersion in the low frequency region. The conduction phenomenon is explained on the basis of a correlated barrier hopping (CBH) model. According to the CBH model, the maximum barrier height at infinite separation (UM) is determined|
|ISSN:||0975-1041 (Online); 0019-5596 (Print)|
|Appears in Collections:||IJPAP Vol.48(08) [August 2010]|
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