NISCAIR Online Periodicals Repository

NISCAIR ONLINE PERIODICALS REPOSITORY (NOPR)  >
NISCAIR PUBLICATIONS >
Research Journals >
Indian Journal of Pure & Applied Physics (IJPAP) >
IJPAP Vol.48 [2010] >
IJPAP Vol.48(07) [July 2010] >


Title: Optimization of CR-39 as neutron dosimeter
Authors: Kumar, Vijay
Sonkawade, R G
Dhaliwal, A S
Keywords: CR-39 polymer
Neutron irradiation
Etching
Track density
UV-vis spectroscopy
Issue Date: Jul-2010
Publisher: CSIR
Abstract:  The chemical etching parameters (etching time, temperature, normality of etchant etc.) for use of CR-39 as neutron dosimeter have been optimized. The CR-39 films placed in polyethylene radiator were exposed to 252Cf neutron source for different time intervals and the neutron fluences were varied from 4.68×106 to 2.7×10n/cm2. Etched tracks were analyzed and counted at 400X with microscope and neutron recoil track density was calculated after every hour of etching. It was found that the track density increases up to a certain etching time and then decreases for higher etching time, which is considered due to removal of shallow tracks and overlapping of the tracks due to their size enlargement. Optimized etching conditions found are, 7 N NaOH solution at 70°C (±) for 9 hr with continuous stirring. However, we found a linear relationship between neutron fluence and track density. UV-visible spectra were also obtained and analyzed for the pristine and neutron irradiated CR-39 films in the wavelength range 200-700 nm at room temperature. As seen from absorption spectra, the absorption edge is shifted towards longer wavelength with increase of fluence and therefore, indicates a decrease in the band gap. The study may be important for the future high energy accelerators and Radioactive Ion Beam Facilities where CR-39 can be used as a neutron dosimeter.
Page(s): 466-469
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Source:IJPAP Vol.48(07) [July 2010]

Files in This Item:

File Description SizeFormat
IJPAP 48(7) 466-469.pdf143.65 kBAdobe PDFView/Open
 Current Page Visits: 643 
Recommend this item

 

National Knowledge Resources Consortium |  NISCAIR Website |  Contact us |  Feedback

Disclaimer: NISCAIR assumes no responsibility for the statements and opinions advanced by contributors. The editorial staff in its work of examining papers received for publication is helped, in an honorary capacity, by many distinguished engineers and scientists.

CC License Except where otherwise noted, the Articles on this site are licensed under Creative Commons License: CC Attribution-Noncommercial-No Derivative Works 2.5 India

Copyright © 2012 The Council of Scientific and Industrial Research, New Delhi. All rights reserved.

Powered by DSpace Copyright © 2002-2007 MIT and Hewlett-Packard | Compliant to OAI-PMH V 2.0

Home Page Total Visits: 558744 since 06-Feb-2009  Last updated on 30-Jul-2014Webmaster: nopr@niscair.res.in