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Title:  Characterization of Ni-doped SrTiO3 ceramics using impedance spectroscopy
Authors: Rout, S K
Panigrahi, S
Bera, J
Keywords: Acceptor
Dielectric properties
Grain boundary
Impedance spectroscopy
Ni-doped SrTiO3
Issue Date: Oct-2004
Publisher: CSIR
Series/Report no.: G01R 27/26; G01N 33/38
Abstract:  The ceramic SrTiO3 (ST) with 0.2 atom % Ni doped was prepared by solid state reaction route. Average grain size of doped samples was measured and found to be 2.8 micron. The relative permittivity and dielectric loss of ST ceramics were found to increase with Ni-doping. The capacitance was measured at temperatures ranging from 400° to 700°C in the frequency range 10 Hz-13MHz. The grain and grain boundaries relaxation frequencies were shifted to higher frequency with temperature. The impedance measurements were conducted at 500°C to separate grain and grain boundary contributions. The bulk and grain boundary resistance was evaluated from impedance complex plain plot and equivalent Resistance-Capacitance (RC) circuit is proposed to model the experimental data.
Description: 741-744
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Appears in Collections:IJPAP Vol.42(10) [October 2004]

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