Please use this identifier to cite or link to this item: http://nopr.niscair.res.in/handle/123456789/9610
Title: Space charge limited conduction in Se<sub>80-x</sub>Te<sub>20</sub>Ag<sub>x</sub> thin films
Authors: Singh, S P
Kumar, S
Kumar, A
Keywords: dc Conductivity
Se<sub>80-x</sub>Te<sub>20</sub>Ag<sub>x</sub> thin films
Space charge limited conduction
Issue Date: Aug-2004
Publisher: CSIR
Series/Report no.: G 01R
Abstract: The dc conductivity measurements at high electric fields in vacuum evaporated thin films of amorphous Se<sub>80-x</sub>Te<sub>20</sub>Ag<sub>x </sub> (<i>x</i>=0,5,10,15) have been reported. The current-voltage (<i>I-V</i>) characteristics have been measured at various fixed temperatures. In all the samples ohmic behaviour is observed at low electric fields. However, at high electric fields (<i>E</i>~10<sup>4</sup>V/cm), non- ohmic behaviour is observed. An analysis of the experimental data confirms the presence of space charge limited conduction (SCLC) in all the glassy materials studied in present case. From the fitting of the data in the theory of SCLC, the density of defect states near the Fermi level is calculated. It is concluded from the results obtained that the density of defect states do not change significantly with increasing concentration of Ag in the pure binary Se<sub>80</sub>Te<sub>20 </sub>system.
Description: 615-620
URI: http://hdl.handle.net/123456789/9610
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Appears in Collections:IJPAP Vol.42(08) [August 2004]

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