Growth impedence of pure CdS films

Abstract

The effect of Al, Fe and Cu incorporated CdS pure thin films prepared by spray pyrolysis process has been given. It was found that the increase of the element concentration leads to a significant change in pure CdS physical properties. The films have a polycrystalline hexagonal structure as shown from their X-ray diffraction pattern (XRD). The crystallinity of pure CdS film is reasonably decreased by the addition of Al, Fe and Cu. The grain size of the pure CdS films decrease by incorporation of Fe, Al and Cu as revealed by atomic force microscopy (AFM). The roughness of all samples was calculated. The optical constants of the prepared samples were determined. The calculated energy band gap of pure CdS films decreases by increasing Cu contents, while it does not get effected by Al contents.