Please use this identifier to cite or link to this item: http://nopr.niscair.res.in/handle/123456789/9559
Title: Growth impedence of pure CdS films
Authors: Soliman, L I
Afify, H H
Battisha, I K
Keywords: Cds films
Growth impedence
Polycrystalline hexagonal structure
Spray pyrolysis process
Optical constants
Issue Date: Jan-2004
Publisher: CSIR
Abstract: The effect of Al, Fe and Cu incorporated CdS pure thin films prepared by spray pyrolysis process has been given. It was found that the increase of the element concentration leads to a significant change in pure CdS physical properties. The films have a polycrystalline hexagonal structure as shown from their X-ray diffraction pattern (XRD). The crystallinity of pure CdS film is reasonably decreased by the addition of Al, Fe and Cu. The grain size of the pure CdS films decrease by incorporation of Fe, Al and Cu as revealed by atomic force microscopy (AFM). The roughness of all samples was calculated. The optical constants of the prepared samples were determined. The calculated energy band gap of pure CdS films decreases by increasing Cu contents, while it does not get effected by Al contents.
Description: 12-17
URI: http://hdl.handle.net/123456789/9559
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Appears in Collections:IJPAP Vol.42(01) [January 2004]

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