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Indian Journal of Pure & Applied Physics (IJPAP) >
IJPAP Vol.42 [2004] >
IJPAP Vol.42(01) [January 2004] >
| Title: | Growth impedence of pure CdS films |
| Authors: | Soliman, L I
Afify, H H
Battisha, I K |
| Keywords: | Cds films
Growth impedence
Polycrystalline hexagonal structure
Spray pyrolysis process
Optical constants |
| Issue Date: | Jan-2004 |
| Publisher: | CSIR |
| Abstract: | The effect of Al, Fe and Cu incorporated CdS pure thin films
prepared by spray pyrolysis process has been given. It was found that the
increase of the element concentration leads to a significant change in pure CdS
physical properties. The films have a polycrystalline hexagonal structure as
shown from their X-ray diffraction pattern (XRD). The crystallinity of pure CdS
film is reasonably decreased by the addition of Al, Fe and Cu. The grain size
of the pure CdS films decrease by incorporation of Fe, Al and Cu as revealed by
atomic force microscopy (AFM). The roughness of all samples was calculated. The
optical constants of the prepared samples were determined. The calculated
energy band gap of pure CdS films decreases by increasing Cu contents, while it
does not get effected by Al contents. |
| Page(s): | 12-17 |
| ISSN: | 0975-1041 (Online); 0019-5596 (Print) |
| Source: | IJPAP Vol.42(01) [January 2004]
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