Please use this identifier to cite or link to this item: http://nopr.niscair.res.in/handle/123456789/8783
Title: Magneto-resistance and<i style=""> I-V </i>characteristic studies of AlSb and InSb thin film bilayer structure
Authors: Singh, M
Vijay, Y K
Keywords: <i style="">I-V </i>characteristic
Magneto resistance
Inter-diffusion
Rutherford backscattering measurements
Bilayer
Issue Date: May-2005
Publisher: CSIR
Series/Report no.: G01R21/10
Abstract: <smarttagtype namespaceuri="urn:schemas-microsoft-com:office:smarttags" name="place"> The<i style=""> I-V </i>characteristic and magneto-resistance of Al-Sb and In-Sb thin films were measured with Cu electrode as the electrical contact. It was found that<i style=""> I-V </i>characteristics are non-linear in nature and magneto-resistance decreases in case of Al-Sb and increases in case of In-Sb thin film bilayer structure. The Rutherford backscattering measurements also indicate the inter-diffusion and the concentration varies with temperature. </smarttagtype>
Description: 383-385
URI: http://hdl.handle.net/123456789/8783
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Appears in Collections:IJPAP Vol.43(05) [May 2005]

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