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Indian Journal of Pure & Applied Physics (IJPAP) >
IJPAP Vol.43 [2005] >
IJPAP Vol.43(05) [May 2005] >
| Title: | Magneto-resistance and I-V characteristic studies of AlSb and InSb thin film bilayer structure |
| Authors: | Singh, M
Vijay, Y K |
| Keywords: | I-V characteristic
Magneto resistance
Inter-diffusion
Rutherford backscattering measurements
Bilayer |
| Issue Date: | May-2005 |
| Publisher: | CSIR |
| IPC Code: | G01R21/10 |
| Abstract: |
The I-V characteristic and
magneto-resistance of Al-Sb and In-Sb thin films were measured with Cu
electrode as the electrical contact. It was found that I-V characteristics are non-linear in nature and magneto-resistance
decreases in case of Al-Sb and increases in case of In-Sb thin film bilayer
structure. The Rutherford backscattering
measurements also indicate the inter-diffusion and the concentration varies
with temperature.
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| Page(s): | 383-385 |
| ISSN: | 0975-1041 (Online); 0019-5596 (Print) |
| Source: | IJPAP Vol.43(05) [May 2005]
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