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IJPAP Vol.43(05) [May 2005] >


Title: Magneto-resistance and I-V characteristic studies of AlSb and InSb thin film bilayer structure
Authors: Singh, M
Vijay, Y K
Keywords: I-V characteristic
Magneto resistance
Inter-diffusion
Rutherford backscattering measurements
Bilayer
Issue Date: May-2005
Publisher: CSIR
IPC CodeG01R21/10
Abstract:  The I-V characteristic and magneto-resistance of Al-Sb and In-Sb thin films were measured with Cu electrode as the electrical contact. It was found that I-V characteristics are non-linear in nature and magneto-resistance decreases in case of Al-Sb and increases in case of In-Sb thin film bilayer structure. The Rutherford backscattering measurements also indicate the inter-diffusion and the concentration varies with temperature.
Page(s): 383-385
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Source:IJPAP Vol.43(05) [May 2005]

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