Please use this identifier to cite or link to this item:
Title: Optical, structural and electrical properties of zinc sulphide vacuum evaporated thin film
Authors: Kumar, Pawan
Kumar, Aravind
Dixit, P N
Sharma, T P
Keywords: Zinc sulphide;Vacuum evaporated thin film;Refractive index;Conductivity
Issue Date: Sep-2006
Publisher: CSIR
IPC Code: H01L 27/00
Abstract: The II-VI group semiconductors are of great importance due to their applications in various opto-electronic devices. Among these semiconductors, zinc sulphide film is the most suitable for its utility in opto-electronic devices. ZnS film has been prepared on glass substrates by using vacuum evaporation method. The optical properties, especially refractive index by transmission spectra of these films have been studied in the wavelength range 400-850 nm using Manifaciers envelope method. The ZnS film has a direct band gap of 3.50 eV. The wurtzite structure of ZnS film has been confirmed by X-ray diffraction analysis. The electrical properties of ZnS especially dark conductivity and photoconductivity at different temperatures have also been studied.
Page(s): 690-693
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Appears in Collections:IJPAP Vol.44(09) [September 2006]

Files in This Item:
File Description SizeFormat 
IJPAP 44(9) 690-693.pdf337.96 kBAdobe PDFView/Open

Items in NOPR are protected by copyright, with all rights reserved, unless otherwise indicated.