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Indian Journal of Pure & Applied Physics (IJPAP) >
IJPAP Vol.44 [2006] >
IJPAP Vol.44(04) [April 2006] >
| Title: | Achieving high signal-to-noise ratio in transient reflectivity measurements |
| Authors: | Vijayaragavan, A R
Chari, R
Oak, S M |
| Keywords: | Transient reflectivity
GaAs thin films |
| Issue Date: | Apr-2006 |
| Publisher: | CSIR |
| IPC Code: | H01L |
| Abstract: | Transient reflectivity measurements using ultrashort pulse
pump-probe techniques can provide very useful information on fast carrier
dynamics in semiconductors. Several non-trivial problems encountered in
measuring reflectivity changes have been described. These changes can be very
small ( R/R
~10-3 or less) and hence measuring these small changes is not
straightforward. The possible solutions in overcoming such problems have been
described. Some preliminary results on a GaAs thin film have also been
presented. |
| Page(s): | 330-333 |
| ISSN: | 0975-1041 (Online); 0019-5596 (Print) |
| Source: | IJPAP Vol.44(04) [April 2006]
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