Please use this identifier to cite or link to this item: http://nopr.niscair.res.in/handle/123456789/8307
Title: Achieving high signal-to-noise ratio in transient reflectivity measurements
Authors: Vijayaragavan, A R
Chari, R
Oak, S M
Keywords: Transient reflectivity;GaAs thin films
Issue Date: Apr-2006
Publisher: CSIR
IPC Code: H01L
Abstract: Transient reflectivity measurements using ultrashort pulse pump-probe techniques can provide very useful information on fast carrier dynamics in semiconductors. Several non-trivial problems encountered in measuring reflectivity changes have been described. These changes can be very small (R/R ~10-3 or less) and hence measuring these small changes is not straightforward. The possible solutions in overcoming such problems have been described. Some preliminary results on a GaAs thin film have also been presented.
Page(s): 330-333
URI: http://hdl.handle.net/123456789/8307
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Appears in Collections:IJPAP Vol.44(04) [April 2006]

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