Please use this identifier to cite or link to this item:
Title: I-V measurements of chalcogenide glass thin films
Authors: Saraswat, Vibhav K
Kishore, Vimal
Saxena, N S
Sharma, T P
Keywords: Chalcogenide glasses;Thin film;I-V characteristics;Se-Sb bonds;dc conductivity
Issue Date: Feb-2006
Publisher: CSIR
IPC Code: G01R
Abstract: Measurements of I-V characteristics of Se85-xTe15Sbx (where x = 2, 4, 6, 8 and 10) glassy thin films have been carried out at ambient conditions. These measurements have been taken using Keithley Electrometer/High Resistance Meter 6517A in its force voltage measure current (FVMI) mode. Measurements show that the film containing 4 at. wt. % of Sb allows the maximum current to pass through itself as compared to other counterparts of this series. The composition dependence of resistance has been explained on the basis of bond formation between Se and Sb at different compositions and hence Se81Te15Sb4 composition could be termed as “critical composition” in the series under test as it is also strongly supported by dc electrical conductivity, thermal conductivity and thermal diffusivity measurements of these materials in bulk. Besides, the linear relationship between ln (I) and V1/2 confirm the conduction mechanism as to be Poole-Frenkel type.
Page(s): 196-200
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Appears in Collections:IJPAP Vol.44(02) [February 2006]

Files in This Item:
File Description SizeFormat 
IJPAP 44(2) 196-200.pdf139.99 kBAdobe PDFView/Open

Items in NOPR are protected by copyright, with all rights reserved, unless otherwise indicated.