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Indian Journal of Pure & Applied Physics (IJPAP) >
IJPAP Vol.44 [2006] >
IJPAP Vol.44(02) [February 2006] >
| Title: | I-V measurements of chalcogenide glass thin films |
| Authors: | Saraswat, Vibhav K
Kishore, Vimal
Saxena, N S
Sharma, T P |
| Keywords: | Chalcogenide glasses
Thin film
I-V characteristics
Se-Sb bonds
dc conductivity |
| Issue Date: | Feb-2006 |
| Publisher: | CSIR |
| IPC Code: | G01R |
| Abstract: | Measurements of I-V characteristics of Se85-xTe15Sbx (where x = 2, 4, 6, 8 and 10) glassy thin films
have been carried out at ambient conditions. These measurements have been taken
using Keithley Electrometer/High Resistance Meter 6517A in its force voltage
measure current (FVMI) mode. Measurements show that the film containing 4 at.
wt. % of Sb allows the maximum current to pass through itself as compared to
other counterparts of this series. The composition dependence of resistance has
been explained on the basis of bond formation between Se and Sb at different
compositions and hence Se81Te15Sb4 composition
could be termed as “critical composition” in the series under test as it is
also strongly supported by dc
electrical conductivity, thermal conductivity and thermal diffusivity
measurements of these materials in bulk. Besides, the linear relationship
between ln (I) and V1/2 confirm the conduction
mechanism as to be Poole-Frenkel type. |
| Page(s): | 196-200 |
| ISSN: | 0975-1041 (Online); 0019-5596 (Print) |
| Source: | IJPAP Vol.44(02) [February 2006]
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