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IJPAP Vol.44(02) [February 2006] >


Title: Optical band gap studies on Zn-Te pellets
Authors: Sharma, R
Saxena, N S
Kumar, S
Sharma, T P
Keywords: Polycrystalline semiconducting material
Reflection spectra
Spectrophotometer
Energy band gap
Issue Date: Feb-2006
Publisher: CSIR
IPC CodeG01J
Abstract: Spectroscopic techniques are very useful for characterizing semiconducting and conducting materials. The optical properties (specially reflection spectra) of ZnxTe100-x (x=5, 10, 30 and 50) material in pellet form were studied. Polycrystalline semiconducting material has been prepared by Melt quenching method by taking pure Zn and pure Se in appropriate atomic weight ratio. The polycrystalline nature of  Zn5Te95 was confirmed by  XRD studies. In order to compare the studies on so prepared polycrystalline material and commercially obtained  pure Zn50Te50 material,  investigations were carried out on both types of samples. From the analysis of reflection spectra, energy band gaps of ZnxTe100-x material have been determined, which were found to increase from 1.67 to 2.31 eV. It is observed that the optical band gap of laboratory prepared Zn50Te50 material is in excellent agreement with that of commercially obtained pure Zn50Te50 material. 
Page(s): 192-195
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Source:IJPAP Vol.44(02) [February 2006]

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