Please use this identifier to cite or link to this item: http://nopr.niscair.res.in/handle/123456789/8261
Title: Optical band gap studies on Zn-Te pellets
Authors: Sharma, R
Saxena, N S
Kumar, S
Sharma, T P
Keywords: Polycrystalline semiconducting material
Reflection spectra
Spectrophotometer
Energy band gap
Issue Date: Feb-2006
Publisher: CSIR
Series/Report no.: G01J
Abstract: Spectroscopic techniques are very useful for characterizing semiconducting and conducting materials. The optical properties (specially reflection spectra) of Zn<sub>x</sub>Te<sub>100-x </sub>(<i style="">x</i>=5, 10, 30 and 50) material in pellet form were studied. Polycrystalline semiconducting material has been prepared by Melt quenching method by taking pure Zn and pure Se in appropriate atomic weight ratio. The polycrystalline nature of  Zn<sub>5</sub>Te<sub>95</sub> was confirmed by  XRD studies. In order to compare the studies on so prepared polycrystalline material and commercially obtained  pure Zn<sub>50</sub>Te<sub>50</sub> material,  investigations were carried out on both types of samples. From the analysis of reflection spectra, energy band gaps of Zn<sub>x</sub>Te<sub>100-x</sub> material have been determined, which were found to increase from 1.67 to 2.31 eV. It is observed that the optical band gap of laboratory prepared Zn<sub>50</sub>Te<sub>50</sub> material is in excellent agreement with that of commercially obtained pure Zn<sub>50</sub>Te<sub>50</sub> material. 
Description: 192-195
URI: http://hdl.handle.net/123456789/8261
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Appears in Collections:IJPAP Vol.44(02) [February 2006]

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