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Indian Journal of Pure & Applied Physics (IJPAP) >
IJPAP Vol.44 [2006] >
IJPAP Vol.44(02) [February 2006] >
| Title: | Transmission electron microscopy of nanomaterials |
| Authors: | Neogy, S
Savalia, R T
Tewari, R
Srivastava, D
Dey, G K |
| Keywords: | Transmission electron microscope
Nanomaterials
High resolution electron microscopy
Microstructural characterization |
| Issue Date: | Feb-2006 |
| Publisher: | CSIR |
| PACS No.: | GO1N |
| Abstract: | Transmission
electron microscope (TEM) has emerged as a very powerful tool for probing the
structure of metals and alloys because of its capability to provide
morphological information, crystallographic details, and chemical composition
of phases distributed on a very fine scale in a given microstructure.
Convergent beam electron diffraction, nano or micro beam diffraction and
selected area diffraction techniques have been used to obtain crystallographic
information whereas structural information is obtained by high-resolution
electron microscopy (HREM). With its multifaceted capabilities such as
nano-beam diffraction, composition analysis and imaging abilities at angstrom
level, TEM has emerged as an instrument for complete characterization of nano
scale microstructure of materials. The use of TEM in the study of various types
of nanomaterials is described in this paper. |
| Page(s): | 119-124 |
| ISSN: | 0975-1041 (Online); 0019-5596 (Print) |
| Source: | IJPAP Vol.44(02) [February 2006]
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