Please use this identifier to cite or link to this item: http://nopr.niscair.res.in/handle/123456789/8238
Title: Dielectric relaxation in glassy Se<sub>70</sub>Te<sub>30-x</sub>Ag<sub>x</sub>
Authors: Choudhary, N
Kumar, A
Keywords: Chalcogenide glasses
Dielectric relaxation
Ternary alloys
Issue Date: Jan-2006
Publisher: CSIR
Series/Report no.: G01R27/26
Abstract: Temperature dependence of dielectric constant (e')and dielectric loss (e") are studied in glassy  Se<sub>70</sub>Te<sub>30-x</sub>Ag<sub>x</sub>where <i style="">x</i> is varied from 0 to 10 in the frequency range 1<sub> </sub>to 10 kHz and temperature range 300-350 K. The results indicate that the dielectric dispersion exists in the above frequency and temperature range. Loss peaks in  e" versus <i style="">T</i> curve could be observed in ternary Se<sub>70</sub>Te<sub>30-x</sub>Ag<sub>x</sub> alloys. However, such loss peaks could not be observed in binary Se<sub>70</sub>Te<sub>30</sub> alloy, which indicates that Ag incorporation in binary system, is responsible for such behaviour. This is explained in terms of [(D<sup>-</sup>) (Ag<sup>+</sup>)] dipoles which otherwise were not present in the undoped samples.
Description: 62-65
URI: http://hdl.handle.net/123456789/8238
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Appears in Collections:IJPAP Vol.44(01) [January 2006]

Files in This Item:
File Description SizeFormat 
IJPAP 44(1) 62-65.pdf122.29 kBAdobe PDFView/Open


Items in NOPR are protected by copyright, with all rights reserved, unless otherwise indicated.