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Indian Journal of Pure & Applied Physics (IJPAP) >
IJPAP Vol.48 [2010] >
IJPAP Vol.48(04) [April 2010] >
| Title: | Structural and magnetic behaviour of NiFe2O4 thin film grown by pulsed laser deposition |
| Authors: | Dixit, Gagan
Singh, J P
Srivastava, R C
Agrawal, H M
Choudhary, R J
Gupta, Ajay |
| Keywords: | Ferrite
Thin films
XRD
AFM
VSM
Pulsed laser deposition |
| Issue Date: | Apr-2010 |
| Publisher: | CSIR |
| Abstract: | NiFe2O4
thin film has been grown on Si (100) substrate by pulsed laser deposition (PLD)
technique. The microstructure of the film was characterised by X-ray
diffractometer (XRD) and atomic force microscopy (AFM). Magnetic
characterisation has been done by vibrating sample magnetometer (VSM). In order
to have comparative study, the bulk (target used for PLD) has also been
characterised by XRD and VSM. Grazing incidence X-ray diffractometer (GIXRD)
pattern of the film confirms the single spinel phase. Results of AFM have shown
that the average grain size of the prepared film is of the order of 47 nm and
surface roughness of the order of 3-4 nm. VSM measurements indicate that for
the film, both the saturation magnetisation and the coercivity are greater than
that of bulk. |
| Page(s): | 287-291 |
| ISSN: | 0975-1041 (Online); 0019-5596 (Print) |
| Source: | IJPAP Vol.48(04) [April 2010]
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