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Indian Journal of Engineering and Materials Sciences (IJEMS) >
IJEMS Vol.13 [2006] >
IJEMS Vol.13(4) [August 2006] >
| Title: | Microstructural features, electrical and optical properties of nanostructured InSb thin films deposited at 373 K |
| Authors: | Singh, Sukhvir
Srivastava, A K
Lal, K
Tomokiyo, Y
Sharma, S K
Kishore, R |
| Issue Date: | Aug-2006 |
| Publisher: | CSIR |
| IPC Code: | H01C17/075 |
| Abstract: | Thin films of InSb
nanocrystals have been deposited onto KCl substrate using a thermal evaporation
technique under high vacuum conditions (~10-6 torr). An intriguing microstructure consisted of
moiré fringes with variable spacings and a corresponding variety of electron diffraction
patterns in reciprocal space are reported at the deposition temperature of 373
K. The nanograins of InSb with preferred orientation and faceted morphology are
delineated. A possible mechanism has been postulated to explain the evolution
of such microstructures. It has been noticed that there is a peculiarity in the
resistivity characteristics and infrared transmittance measurements obtained on
these films. A set of electron micrographs, diffraction patterns and properties
have been evaluated and discussed to understand the role of nanocrystals
constituting the thin film, and certain types of defects introduced in the
microstructure while deposition, on these properties. |
| Page(s): | 339-346 |
| ISSN: | 0975-1017 (Online); 0971-4588 (Print) |
| Source: | IJEMS Vol.13(4) [August 2006]
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