Please use this identifier to cite or link to this item: http://nopr.niscair.res.in/handle/123456789/6894
Title: Role of bilayer chain coupling on junction voltage in layered high temperature cuprate superconductors
Authors: Singh, Mahipal
Keywords: Layered high-Tc cuprates
Josephson effect
Bilayer-chain coupling
Junction voltage
Issue Date: Jan-2010
Publisher: CSIR
Abstract: The junction voltage as a function of hopping matrix element for CuO-chains, hopping of the single particle from bilayer to chain, Josephson like Cooper pair tunneling and other microscopic interactions that exit in bilayer high temperature cuprate superconductors has been studied. For this purpose, a tight binding model Hamiltonian that includes various intra and inter-bilayer interactions alongwith contributions of Josephson-like tunneling of Cooper pairs from bilayer of CuO2 planes to CuO-chains and vice-versa as well as single particle hopping between CuO2 bilayer to CuO-chains in the form of bilayer chain interaction within a unit cell has been considered. The situation considered here is equivalent to a Josephson’s coupled SNS junction. In the superconducting state, the CuO2 bilayer acts as superconducting electrode and CuO-chains as one dimensional metal under fully oxygenated overdoped state sandwiched between these two electrodes as in the case of YBa2Cu3O7 bilayer system. There is always a possibility of Cooper pairs to tunnel from one bilayer CuO2 planes to other bilayer via CuO-chains. Using Green’s function technique, we have obtained expressions for superconducting order parameter, carrier density and junction voltage within BCS formalism. The numerical analysis shows that in bilayer cuprates, the junction voltage depends on the interlayer pair tunneling between the CuO2 planes, hopping matrix element (tch) for chains and the hopping of single particle from bilayer to chains. Finally, we have compared our theoretical results on junction voltage with the existing experimental results.
Description: 52-58
URI: http://hdl.handle.net/123456789/6894
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Appears in Collections:IJPAP Vol.48(01) [January 2010]

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