Please use this identifier to cite or link to this item: http://nopr.niscpr.res.in/handle/123456789/58310
Title: Low Energy X-ray Photons Induced Changes in Lexan Films
Authors: P M, Raveesha
K, Hareesh
V P, Dhamgaye
S D, Dhole
Sanjeev, Ganesh
Keywords: Lexan films;X-ray photons;XRD;FTIR;Microhardness;SEM;Contact angle
Issue Date: Oct-2021
Publisher: NIScPR-CSIR, India
Abstract: 40 keV Synchrotron X-ray photons were made to fall on Lexan polycarbonate films at different exposure time. The low energy X-ray photons assisted modification in terms of physico-chemical properties of Lexan films were studied using Fourier Transform Infrared (FTIR) spectrophotometer, X-Ray Diffractogram (XRD), Vicker’s Microhardness Tester, Scanning Electron Microscope (SEM) and Contact Angle Meter. FTIR result mainly includes decrease in the C=C stretching and C-C stretching of aromatics after irradiation. XRD analysis shows a slight decrease in the crystallinity after irradiation. Vicker’s microhardness test reveals the decrement in microhardness of Lexan films after irradiation. SEM result shows irradiation induced changes in the surface morphology. Contact angle measurement shows increase in the water contact angle in irradiated Lexan films.
Page(s): 706-710
ISSN: 0975-0959 (Online); 0301-1208 (Print)
Appears in Collections:IJPAP Vol.59(10) [October 2021]

Files in This Item:
File Description SizeFormat 
IJPAP 59(10) 706-710.pdf797.39 kBAdobe PDFView/Open


Items in NOPR are protected by copyright, with all rights reserved, unless otherwise indicated.