Please use this identifier to cite or link to this item: http://nopr.niscair.res.in/handle/123456789/54210
Full metadata record
DC FieldValueLanguage
dc.contributor.authorKumar, Kameshwar-
dc.contributor.authorThakur, Nagesh-
dc.date.accessioned2020-03-20T05:40:49Z-
dc.date.available2020-03-20T05:40:49Z-
dc.date.issued2020-03-
dc.identifier.issn0975-0959 (Online); 0301-1208 (Print)-
dc.identifier.urihttp://nopr.niscair.res.in/handle/123456789/54210-
dc.description189-192en_US
dc.description.abstractThe present paper reports the dc conductivity measurement up to 100 V for pallets of Te15 (Se100-xBix)85 (x=0, 1, 2, 3, 4 at %) glassy alloys in temperature range (303-343 K). The dc conductivity is calculated from the I-V characteristics curves of the pellets of bulk samples prepared by melt quenching technique. The samples obey Ohm’s law in the lower (0-25 V) voltage range whereas the behaviour in the higher (25-100 V) voltage range is non-ohmic. The experimental results for all the samples fit well with the theory of space charge limited conduction SCLC for uniform distribution of localized states in the mobility gap. The density of defect states is calculated for the glassy alloys and is found to increase with Bi content. The increase in defect density of states can be explained on basis of electro negativity difference of Bi as compared to host elements. The increase in dc conductivity is probably due to Se-Bi bond concentration in the Se-Te-Bi glasses.en_US
dc.language.isoen_USen_US
dc.publisherNISCAIR-CSIR, Indiaen_US
dc.rights CC Attribution-Noncommercial-No Derivative Works 2.5 Indiaen_US
dc.sourceIJPAP Vol.58(03) [March 2020]en_US
dc.subjectChalcogenide glassesen_US
dc.subjectSpace charge limited conductionen_US
dc.subjectLocalized statesen_US
dc.subjectDensity of statesen_US
dc.titleConduction mechanism and defect density of states in amorphous Te15 (Se100-xBix)85 glassy alloysen_US
dc.typeArticleen_US
Appears in Collections:IJPAP Vol.58(03) [March 2020]

Files in This Item:
File Description SizeFormat 
IJPAP 58(3) 189-192.pdf234.52 kBAdobe PDFView/Open


Items in NOPR are protected by copyright, with all rights reserved, unless otherwise indicated.