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Title: Automated measurements of junction characteristics to evaluate parameters for semiconductor diodes
Authors: Patel, P K
Kheraj, V A
Panchal, C J
Desai, M S
Vakil, P D
Patel, K J
Keywords: Semiconductor diode junction characteristics
LabVIEW automation
Issue Date: Jul-2009
Publisher: CSIR
Abstract: Using National Instrument’s LabVIEW (Laboratory Virtual Instrument Engineering Workbench), a graphical programming language, we have measured the junction characteristics of different diodes in the temperature range 273-373 K. The PCI-6024E Data Acquisition Board and BNC-2120 for the acquisition of the data have been used. LabVIEW’s Controls and Functions enable one to control the experiment, measure the parameters, analyze and process the data. Ideality factor<i style=""> </i><img src='/image/spc_char/Etta.gif'>, reverse saturation current<i> I</i><sub>0</sub>, and material constant <i style="">B </i>have been evaluated using <i>I</i>-<i>V</i><i style=""> </i>characteristics. The barrier height <img src='/image/spc_char/phi.gif'><sub>B</sub> and the band-gap energy <i style="">E</i><sub>G</sub>, have been measured and compared using both <i>I</i>-<i>V</i><i style=""> </i>and <i>C</i>-<i>V</i><i style=""> </i>characteristics. For Schottky diode, the series resistance <i style="">R</i><sub>S</sub>,<i style=""> </i>and <img src='/image/spc_char/phi.gif'><sub>B</sub> can be calculated using the Norde method. The band-gap energy has been measured using constant current source. Here, we have characterized <i>p</i>-<i>n</i> junction diodes viz. 1N5402, 1N5408, 1N4148, and 6A4. In addition, LabVIEW may be used to characterize other junction diodes like zener diode, LED, varactor diode, Schottky diode, etc.
Description: 517-522
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Appears in Collections:IJPAP Vol.47(07) [July 2009]

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