Automated measurements of junction characteristics to evaluate parameters for semiconductor diodes

Abstract

Using National Instrument’s LabVIEW (Laboratory Virtual Instrument Engineering Workbench), a graphical programming language, we have measured the junction characteristics of different diodes in the temperature range 273-373 K. The PCI-6024E Data Acquisition Board and BNC-2120 for the acquisition of the data have been used. LabVIEW’s Controls and Functions enable one to control the experiment, measure the parameters, analyze and process the data. Ideality factor<i style=""> </i><img src='/image/spc_char/Etta.gif'>, reverse saturation current<i> I</i>₀, and material constant <i style="">B </i>have been evaluated using <i>I</i>-<i>V</i><i style=""> </i>characteristics. The barrier height <img src='/image/spc_char/phi.gif'>_B and the band-gap energy <i style="">E</i>_G, have been measured and compared using both <i>I</i>-<i>V</i><i style=""> </i>and <i>C</i>-<i>V</i><i style=""> </i>characteristics. For Schottky diode, the series resistance <i style="">R</i>_S,<i style=""> </i>and <img src='/image/spc_char/phi.gif'>_B can be calculated using the Norde method. The band-gap energy has been measured using constant current source. Here, we have characterized <i>p</i>-<i>n</i> junction diodes viz. 1N5402, 1N5408, 1N4148, and 6A4. In addition, LabVIEW may be used to characterize other junction diodes like zener diode, LED, varactor diode, Schottky diode, etc.