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http://nopr.niscair.res.in/handle/123456789/5064
Title: | Automated measurements of junction characteristics to evaluate parameters for semiconductor diodes |
Authors: | Patel, P K Kheraj, V A Panchal, C J Desai, M S Vakil, P D Patel, K J |
Keywords: | Semiconductor diode junction characteristics;LabVIEW automation |
Issue Date: | Jul-2009 |
Publisher: | CSIR |
Abstract: | Using National Instrument’s LabVIEW (Laboratory Virtual Instrument Engineering Workbench), a graphical programming language, we have measured the junction characteristics of different diodes in the temperature range 273-373 K. The PCI-6024E Data Acquisition Board and BNC-2120 for the acquisition of the data have been used. LabVIEW’s Controls and Functions enable one to control the experiment, measure the parameters, analyze and process the data. Ideality factor ![]() ![]() ![]() |
Page(s): | 517-522 |
URI: | http://hdl.handle.net/123456789/5064 |
ISSN: | 0975-1041 (Online); 0019-5596 (Print) |
Appears in Collections: | IJPAP Vol.47(07) [July 2009] |
Files in This Item:
File | Description | Size | Format | |
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IJPAP 47(7) 517-522.pdf | 506.93 kB | Adobe PDF | View/Open |
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