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Title: Automated measurements of junction characteristics to evaluate parameters for semiconductor diodes
Authors: Patel, P K
Kheraj, V A
Panchal, C J
Desai, M S
Vakil, P D
Patel, K J
Keywords: Semiconductor diode junction characteristics
LabVIEW automation
Issue Date: Jul-2009
Publisher: CSIR
Abstract: Using National Instrument’s LabVIEW (Laboratory Virtual Instrument Engineering Workbench), a graphical programming language, we have measured the junction characteristics of different diodes in the temperature range 273-373 K. The PCI-6024E Data Acquisition Board and BNC-2120 for the acquisition of the data have been used. LabVIEW’s Controls and Functions enable one to control the experiment, measure the parameters, analyze and process the data. Ideality factor , reverse saturation current I0, and material constant B have been evaluated using I-V characteristics. The barrier height B and the band-gap energy EG, have been measured and compared using both I-V and C-V characteristics. For Schottky diode, the series resistance RS, and B can be calculated using the Norde method. The band-gap energy has been measured using constant current source. Here, we have characterized p-n junction diodes viz. 1N5402, 1N5408, 1N4148, and 6A4. In addition, LabVIEW may be used to characterize other junction diodes like zener diode, LED, varactor diode, Schottky diode, etc.
Description: 517-522
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Appears in Collections:IJPAP Vol.47(07) [July 2009]

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