Please use this identifier to cite or link to this item: http://nopr.niscair.res.in/handle/123456789/49768
Title: Low energy ion beam study on Co/CoO thin films
Authors: Kumar, Deepak
Bhattacharyya, A S
Keywords: Low energy ion beam (LEIB);FM/AFM system;SRIM;Dewetting
Issue Date: Aug-2019
Publisher: NISCAIR-CSIR, India
Abstract: Computer simulation using SRIM software has been done for ion beam irradiation of different metal ions on Co/CoO thin film which is an FM/AFM system. The films have been experimentally deposited by magnetron sputtering and subjected to low energy ion beams (LEIB) of different energies and fluences. The variation of Si ion energy led to different ion distribution profiles which could be correlated with the morphological changes like dewetting occurring at the surface. Such phenomenon is potentially important for making spintronic devices in future.
Page(s): 605-606
URI: http://nopr.niscair.res.in/handle/123456789/49768
ISSN: 0975-0959 (Online); 0301-1208 (Print)
Appears in Collections:IJPAP Vol.57(08) [August 2019]

Files in This Item:
File Description SizeFormat 
IJPAP 57(8) 605-606.pdf1.66 MBAdobe PDFView/Open


Items in NOPR are protected by copyright, with all rights reserved, unless otherwise indicated.