Please use this identifier to cite or link to this item:
Title: Hydrogen induced resistance and optical transmittance of pulsed laser deposited Pd/Mg thin films
Authors: Gautam, Yogendra K
Kumar, Ashwani
Ambedkar, Anit K
Kumar, Vipin
Singh, Beer Pal
Keywords: Palladium;MgH2 thin film;Hydrogen sensor;Pulsed laser deposition;Electrical measurement
Issue Date: Jun-2019
Publisher: NISCAIR-CSIR, India
Abstract: The hydrogen detection is an important issue for the societal acceptance of H2 as energy carrier. In present research work, we have investigated hydrogen sensing and optical properties of Pd/Mg thin films on glass substrate deposited by pulsed laser (PL). As-deposited thin films have been exposed (hydrogenation) to H2 gas (2 bar) at room temperature in a hydrogenation unit. Hydrogenated and dehydrogenated (at different temperatures) samples have been characterized using X-ray diffractometer (XRD), field-emission scanning electron microscopy (FE-SEM), UV-Vis-NIR spectrophotometer, atomic force microscopy (AFM). XRD results confirm the formation of hydride (MgH2) tetragonal phase upon hydrogenation of Pd/Mg films. Hydrogen induced resistance response of Pd/Mg films has been measured in-situ during hydrogenation/dehydrogenation process by using two- probe electrical method. The response time (sensitivity) of Pd/Mg films for hydrogen gas is ~ 60 s at room temperature. The study of optical transmittance of hydrogenated Pd/Mg films indicates their switchable mirror behavior.
Page(s): 96-100
ISSN: 2581-8198 (Online)
Appears in Collections:AIR Vol.01(2) [June 2019]

Files in This Item:
File Description SizeFormat 
AIR 1(2) 96-100.pdf1.1 MBAdobe PDFView/Open

Items in NOPR are protected by copyright, with all rights reserved, unless otherwise indicated.