Please use this identifier to cite or link to this item: http://nopr.niscair.res.in/handle/123456789/44862
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dc.contributor.authorSujatha, R-
dc.contributor.authorKhan, Abdul Rehman-
dc.contributor.authorRavindra, M-
dc.contributor.authorDamle, R-
dc.date.accessioned2018-08-10T11:50:23Z-
dc.date.available2018-08-10T11:50:23Z-
dc.date.issued2018-08-
dc.identifier.issn0975-0959 (Online); 0301-1208 (Print)-
dc.identifier.urihttp://nopr.niscair.res.in/handle/123456789/44862-
dc.description587-590en_US
dc.description.abstractMOSFET is a basic component of VLSI and ULSI circuits and finds applications in many electronic systems used in satellite design. These devices are susceptible to degradation due to radiation in outer space. Conventional MOSFET can survive 3-10 krad (Si) of total dose without much parametric degradation. However, ionising radiation dose in excess of 35 krad (Si) may turn out to be detrimental to the functioning of the device. The space environment is hostile to the most integrated components such as those for navigation, communication, data processing function in satellites and various space missions. The radiation generally encountered in space includes α, β, γ, X-ray, energetic electrons, protons, neutrons and ions of various kinds. Gamma ray photons deposit energy in the components mainly by ionisation. In this paper, we report the gamma ray induced changes in the electrical characteristics of MOSFET 2N6796 (JANTXV) used in satellites. Pre-irradiation measurements of electrical parameters have been made using TESEC measurement system. Selected devices have been exposed to different gamma dose using a BRIT gamma irradiator. Post-irradiation measurements of electrical characteristics display significant degradation in threshold voltages and the leakage current increases as the gamma dose increases.en_US
dc.language.isoen_USen_US
dc.publisherNISCAIR-CSIR, Indiaen_US
dc.rights CC Attribution-Noncommercial-No Derivative Works 2.5 Indiaen_US
dc.sourceIJPAP Vol.56(08) [August 2018]en_US
dc.subjectMOSen_US
dc.subjectRadiation effecten_US
dc.subjectGamma doseen_US
dc.subjectThreshold voltageen_US
dc.subjectLeakage currenten_US
dc.titleStudy of the effect of gamma radiation on MOSFET for space applicationsen_US
dc.typeArticleen_US
Appears in Collections:IJPAP Vol.56(08) [August 2018]

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