Please use this identifier to cite or link to this item:
http://nopr.niscair.res.in/handle/123456789/44846| Title: | Depth profiling of sodium and lithium doped samples using Rutherford backscattering spectrometry |
| Authors: | Mandal, R Dev, B N Bhoraskar, V N Sengupta, D |
| Keywords: | Rutherford backscattering;Depth profile;Diffusion;Teflon;Irradiation effect |
| Issue Date: | Aug-2018 |
| Publisher: | NISCAIR-CSIR, India |
| Abstract: | Various samples of Teflon chemically doped with lithium and sodium have been irradiated with hydrogen ions in order to study the depth profile using Rutherford backscattering (RBS) spectrometry which can detect even microgram of sample. Studies have also been done to see the effects of irradiation on the samples after and before doping them with sodium or lithium. Co-60 gamma-rays (1.17 and 1.33 MeV) and 1 MeV electrons have been used for irradiation. |
| Page(s): | 650-652 |
| URI: | http://nopr.niscair.res.in/handle/123456789/44846 |
| ISSN: | 0975-0959 (Online); 0301-1208 (Print) |
| Appears in Collections: | IJPAP Vol.56(08) [August 2018] |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| IJPAP 56(8) 650-652.pdf | 112.28 kB | Adobe PDF | View/Open |
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