Please use this identifier to cite or link to this item: http://nopr.niscair.res.in/handle/123456789/42780
Title: Determination of defect density, crystallite size and number of graphene layers in graphene analogues using X-ray diffraction and Raman spectroscopy
Authors: Sharma, Rahul
Chadha, Neakanshika
Saini, Parveen
Keywords: Graphitic oxide;Graphene;Reduced graphitic oxide;Raman Spectroscopy;D-band;G-band;Defect density;Crystallite size;sp2 domains;X-ray diffraction;Full width half maximum
Issue Date: Sep-2017
Publisher: NISCAIR-CSIR, India
Abstract: In this study, X-ray diffraction and Raman spectroscopic techniques have been wielded for determination of number of graphene layers per domain, crystallite size, interlayer spacing and defect density in bulk samples of chemically synthesized graphitic oxide (GrO) and reduced GrO (RGrO). Particularly, the ready to use and general mathematical equations have been presented for obtaining above mentioned parameters directly using the full width half maxima (FWHM) of XRD peaks and intensity ratios of Raman D- and G-bands. The results reflect that upon reduction, crystallites shrink in dimensions ultimately leads to decrease in number of graphene layers per domain and apparent increase in defect density.
Page(s): 625-629
URI: http://nopr.niscair.res.in/handle/123456789/42780
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Appears in Collections:IJPAP Vol.55(09) [September 2017]

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