Please use this identifier to cite or link to this item: http://nopr.niscair.res.in/handle/123456789/4093
Title: Growth and characterization of NLO crystal
Authors: Kumari, R Ananda
Keywords: ADP crystals
Second harmonic generation efficiency
Dielectric constant
Dielectric loss
Issue Date: May-2009
Publisher: CSIR
Abstract: Pure ammonium dihydrogen orthophosphate (ADP) crystals and ADP crystals doped with nitrite tri-acetic acid and ethylene diamine tetra acetic acid (EDTA) have been grown by slow evaporation technique. Grown crystals have been characterized using X-ray diffraction and energy dispersive X-ray spectroscopy (EDAX). Second harmonic generation (SHG) efficiency measurements are carried out by Kurtz method. It has been found that the ADP crystals containing nitrite tri acetic acid and EDTA have resulted appreciable increase in SHG efficiency as compared to pure ADP crystals. Dielectric constant and dielectric loss are measured as a function of frequency. Study confirms the contribution of space charge polarization.
Description: 369-371
URI: http://hdl.handle.net/123456789/4093
ISSN: 0019-5596
Appears in Collections:IJPAP Vol.47(05) [May 2009]

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