Please use this identifier to cite or link to this item: http://nopr.niscair.res.in/handle/123456789/39036
Title: Characterization of zincblende CuInS2 nanostructured film: The XRD, Raman, FT-IR and UV-vis spectroscopical investigations
Authors: Hurma, T
Keywords: Zincblende CuInS2 film;XRD;Optical properties
Issue Date: Dec-2016
Publisher: NISCAIR-CSIR, India
Abstract: Zincblende semiconductor CuInS2 has not been focus of studies until recently. Ultrasonic spray pyrolysis (USP) method is used to deposit zincblende CuInS2 nanostructured film on glass substrate at 250 °C in this study. The film was characterized by vibrational (FT-IR and Raman) spectroscopy, X-ray diffraction (XRD), scanning electron microscopy (SEM) and UV-vis spectra. The crystallite size was calculated to be around 30 nm by using the well- known Scherrer equation with the peak corresponding to (111) plane. The Raman peak at 306 cm-1 is assigned to the A1 mode of the CuAu-ordered CuInS2. Thus, metastable cubic zincblende structure would be evidenced. The absorption coefficient of the film has been found to be in the order of 104-105 cm−1, which make it promising for an intensive optoelectronic application.
Page(s): 797-801
URI: http://nopr.niscair.res.in/handle/123456789/39036
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Appears in Collections:IJPAP Vol.54(12) [December 2016]

Files in This Item:
File Description SizeFormat 
IJPAP 54(12) 797-801.pdf317 kBAdobe PDFView/Open


Items in NOPR are protected by copyright, with all rights reserved, unless otherwise indicated.