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|Title:||Characterization of zincblende CuInS2 nanostructured film: The XRD, Raman, FT-IR and UV-vis spectroscopical investigations|
|Keywords:||Zincblende CuInS2 film;XRD;Optical properties|
|Abstract:||Zincblende semiconductor CuInS2 has not been focus of studies until recently. Ultrasonic spray pyrolysis (USP) method is used to deposit zincblende CuInS2 nanostructured film on glass substrate at 250 °C in this study. The film was characterized by vibrational (FT-IR and Raman) spectroscopy, X-ray diffraction (XRD), scanning electron microscopy (SEM) and UV-vis spectra. The crystallite size was calculated to be around 30 nm by using the well- known Scherrer equation with the peak corresponding to (111) plane. The Raman peak at 306 cm-1 is assigned to the A1 mode of the CuAu-ordered CuInS2. Thus, metastable cubic zincblende structure would be evidenced. The absorption coefficient of the film has been found to be in the order of 104-105 cm−1, which make it promising for an intensive optoelectronic application.|
|ISSN:||0975-1041 (Online); 0019-5596 (Print)|
|Appears in Collections:||IJPAP Vol.54(12) [December 2016]|
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