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|Title:||RF loss profile measurement for a high gain, broadband helix TWT|
|Keywords:||Travelling wave tube;Helix;Reflections|
|Abstract:||Helix type structure is widely used as slow wave structure in the travelling wave tube (TWT) due to its natural wide bandwidth. Reflections present in the structure may cause oscillations and hence instability in the device. In order to minimize the reflections, a coating of lossy material is done on the helix support rods in a TWT. The loss introduced by such coating has significant effects on the characteristics of the device. In the conventional methods the loss due to this coating (also known as the loss profiles) can be measured only on a single rod before fabrication of the slow wave structure (SWS) assembly. In the present work a new and convenient method has been developed for the measurement of loss profiles of a fabricated SWS assembly. Using the new method an experimental study has been made on a high gain TWT that is made in two sections with sever in between. The loss profiles along the axis of helical SWS have been measured at the sever end. This measurement is found to be very helpful to ensure the accuracy of the final fabricated assembly.|
|Appears in Collections:||IJRSP Vol.35(2) [April 2006]|
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