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Title: An automated IC chip marking inspection system for surface mounted devices on taping machines
Authors: Chen, Shih-Hung
Liao, Te-Tan
Keywords: Learning vector quantization;On-line inspection;Surface mounted device
Issue Date: May-2009
Publisher: CSIR
Abstract: This study presents a new automated system for inspecting markings on surface mounted devices (SMDs) prior to packaging. In proposed design, marking region is identified using a normalized cross-correlation template-matching scheme. A multiresolution pyramid image processing approach is used to enhance speed of search process. Target image is filtered using a hybrid digital logic filter (DLC) / mean and standard deviation gray scale (MSDGS) algorithm for noise filtering. Individual characters in marking are segmented and fed to a neural network for automatic recognition. DLC / MSDGS filtering scheme is found more straightforward and far more robust toward a noise filtering than conventional image processing schemes. System achieves a recognition rate of 99.14% with identifying each IC chip marking within 0.05 sec. System provides an ideal solution for real-time inspection of IC markings in high-throughput SMD packaging applications.
Page(s): 361-366
ISSN: 0022-4456
Appears in Collections:JSIR Vol.68(05) [May 2009]

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