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Journal of Scientific and Industrial Research (JSIR) >
JSIR Vol.68 [2009] >
JSIR Vol.68(05) [May 2009] >
| Title: | An automated IC chip marking inspection system for surface mounted devices on taping machines |
| Authors: | Chen, Shih-Hung
Liao, Te-Tan |
| Keywords: | Learning vector quantization
On-line inspection
Surface mounted device |
| Issue Date: | May-2009 |
| Publisher: | CSIR |
| Abstract: | This study presents a new automated system for inspecting markings on surface mounted devices (SMDs) prior to packaging.
In proposed design, marking region is identified using a normalized cross-correlation template-matching scheme. A multiresolution
pyramid image processing approach is used to enhance speed of search process. Target image is filtered using a
hybrid digital logic filter (DLC) / mean and standard deviation gray scale (MSDGS) algorithm for noise filtering. Individual
characters in marking are segmented and fed to a neural network for automatic recognition. DLC / MSDGS filtering scheme is
found more straightforward and far more robust toward a noise filtering than conventional image processing schemes. System
achieves a recognition rate of 99.14% with identifying each IC chip marking within 0.05 sec. System provides an ideal
solution for real-time inspection of IC markings in high-throughput SMD packaging applications. |
| Page(s): | 361-366 |
| ISSN: | 0022-4456 |
| Source: | JSIR Vol.68(05) [May 2009]
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