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Title: Scanning Electron Microscopic Studies on Jute Yarn: Effect of Twist on Surface Structure
Authors: Ray, P K
Sengupta, P
Das, B K
Keywords: Jute yarn;Scanning electron microscopy
Issue Date: Dec-1986
Publisher: NISCAIR-CSIR, India
Abstract: Scanning electron microscopic studies of jute yarns of different twists and counts showed that at low twists, all the filaments in the yarn did not lie in the direction of twist; as the twist gradually increased, the filaments took up the direction of the twist and made the yarn structure compact. Although some of the jute filaments making up the yarn suffered various types of damage during processing, increased damage like surface peeling, cracks and, in some cases, complete fracture of surface filaments in the yarn of higher twist took place. At lower twists the effect of carding on the filaments was predominant, and at higher twists both carding and twisting resulted in damaging effects on the filaments.
Page(s): 204-207
ISSN: 0975-1025 (Online); 0971-0426 (Print)
Appears in Collections:IJFTR Vol.11(4) [December 1986]

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