Please use this identifier to cite or link to this item:
Title: Finite element modeling of nanoindentation to extract load-displacement characteristics of bulk materials and thin films
Authors: Rao, Ch Srinivasa
Reddy, C Eswara
Keywords: Nanoindentation;FEM;Bulk materials;Thin films;Loading-unloading characteristics
Issue Date: Jan-2009
Publisher: CSIR
Abstract: The finite element modeling (FEM) technique has been applied to study the loading-unloading characteristics, stress and strain fields of the bulk materials such as titanium, iron, copper and thin films of titanium and copper subjected to Berkovich nanoindentation process. The loading and unloading curves obtained from numerical simulation results are compared with the curves obtained earlier through the experimental results and a good agreement has been found. The substrate effect is ignored and only thin film behaviour under indentation is considered. The thin films are indented within 5% thickness, rather than 10% rule of thumb.
Page(s): 54-59
ISSN: 0019-5596
Appears in Collections:IJPAP Vol.47(01) [January 2009]

Files in This Item:
File Description SizeFormat 
IJPAP 47(1) 54-59.pdf601.19 kBAdobe PDFView/Open

Items in NOPR are protected by copyright, with all rights reserved, unless otherwise indicated.