Please use this identifier to cite or link to this item: http://nopr.niscair.res.in/handle/123456789/30646
Title: Crystal growth and characterization of thiourea mixed ammonium dihydrogen phosphate
Authors: Jayarama, A
Dharmaprakash, S M
Keywords: Crystal growth;Ammonium dihydrogen phosphate;FTIR;Microhardness
Issue Date: Jun-2006
Publisher: NISCAIR-CSIR, India
IPC Code: C30B
Abstract: Single crystals of thiourea mixed ammonium dihydrogen phosphate (TADP) have been grown in solution by slow evaporation technique at ambient temperature (30°C). TADP crystallises in body centered tetragonal system with unit cell parameters a= 7.4652Ǻ, b=7.4970Ǻ, c=7.5415Ǻ. The powder X-ray diffraction pattern has been recorded and indexed. The UV-Vis-NIR transmittance and FT-IR spectrum have been recorded in the range 200-1500 nm and 400-4000 cm-1, respectively. The lower cut-off wavelength is 230 nm in the UV region, which is higher than that of ADP crystal. The presence of functional groups has been confirmed by FTIR analysis. The microhardness of TADP was evaluated using Vicker's indentation method. TADP crystals are thermally stable up to 200°C and shows optical non-linearity for Nd:YAG laser at 1.064 µm wavelength. The preliminary data indicate that the harmonic generation efficiency of TADP is three times that of pure ADP.
Page(s): 455-460
URI: http://hdl.handle.net/123456789/30646
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Appears in Collections:IJPAP Vol.44(06) [June 2006]

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