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Title: Ramification of uncertainty due to limited resolution of universal measuring machine
Authors: Sanjid, Arif M
Nasrin, M
Chaudhary, K P
Singhal, R P
Keywords: Uncertainty;Resolution;Laser interferometer;Adaptation amplification;Photoreceptor
Issue Date: May-2005
Publisher: NISCAIR-CSIR, India
IPC Code: G01B9/02
Abstract: Universal measuring machine (UMM) is a fundamental displacement-measuring machine equipped with reference standard scale attached to its movable-bed. A microscope is fixed rigidly on the UMM to locate the graduation marks on the reference scale. As the movable-bed moves, the reference scale under the microscope also moves. Therefore, the microscope locates new graduation mark of the reference scale correspondingly. It has been observed that the readings are dependent on the direction (i.e. left to right and right to left) of the movement of the movable-bed. Experiments are performed using a displacement laser interferometer to investigate this problem. It is found that the limited resolution of the microscope, properties of eye and the criterion for the acceptance of reading in the microscope are influencing factors. The effective error components are found experimentally. Based on the error components, the uncertainty due to limited resolution of UMM has been ramified. A novel sensing approach for detecting the graduation marks is described in this paper.
Page(s): 319-328
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Appears in Collections:IJPAP Vol.43(05) [May 2005]

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