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Title: Copper phthalocyanine films for photovoltaic applications
Authors: Gupta, Himani
Mahajan, Arnan
Bedi, R K
Keywords: Evaporation;Copper phthalocyanine;Scanning electron microscopy;X-ray diffraction;Electrical properties;Optical properties;Photovoltaic devices
Issue Date: Jun-2008
Publisher: NISCAIR-CSIR, India
Abstract: Hot wall technique has been used to grow a series of copper phthalocyanine (CuPc) films. These samples have been studied for their structural, optical and electrical properties. The X-ray diffraction and SEM pattern of these films show crystalline behaviour of films. The electrical conductivity and optical band gap of the films increase with increase in substrate temperature, whereas activation energy decreases. The activation energy of the films is found to lie in the range 0.45-0.55 eV. Analysis of optical absorption measurements on the films indicates that the interband transitions energies lie in the range 2.3-2.55 eV. Keeping in view, the electrical and optical properties of CuPc films single layer (fluorine doped tin oxide/CuPc/aluminium) and double layer (fluorine doped tin oxide/crystal violet/CuPc/aluminium) junctions have been fabricated under different experimental conditions. The J-V relationship for the single and double layer devices are found to be in good agreement with standard diode equation.
Page(s): 435-438
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Appears in Collections:IJPAP Vol.46(06) [June 2008]

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