Please use this identifier to cite or link to this item:
Title: Microstructural studies of nanocrystalline thin films of V₂O₅-MoO₃ using X-ray diffraction, optical absorption and laser micro Raman spectroscopy
Authors: Acharya, B S
Nayak, B B
Keywords: Synthesis and characterization
X-ray diffraction
Vanadium oxide
Molybdenum oxide
Optical properties
Micro Raman spectra
Issue Date: Dec-2008
Publisher: CSIR
Abstract: Compound thin and thick films of V₂O₅-MoO₃ system deposited on plane glass and conducting glass by electron beam and vacuum deposition have been studied by X-ray diffraction, optical absorption, high temperature in-situ X-ray diffraction and laser micro Raman spectroscopy. The films were also subjected to hydrogen insertion through plasma technique. The band gaps of these films were found to lie in the range 2.26-2.84 eV and the variation in the band gaps of these compound thin films does not follow a linear relationship with the composition. This non-linear variation of the band gap has been explained on the basis of pseudo potential approach advocated by Philips and bond order length strength (BOLS) effect in nano crystalline semiconducting thin films. The interference pattern obtained in the transmission spectra has been utilized to calculate the film thickness which agrees well with that of the value obtained by weight difference method. Laser micro Raman spectra were studied for the films. Several bands observed for these thin films have been explained on the basis of different bending, stretching and lattice phonon vibration modes occurring in the films.
Description: 866-875
ISSN: 0019-5596
Appears in Collections:IJPAP Vol.46(12) [December 2008]

Files in This Item:
File Description SizeFormat 
IJPAP 46(12) 866-875.pdf846.42 kBAdobe PDFView/Open

Items in NOPR are protected by copyright, with all rights reserved, unless otherwise indicated.