Please use this identifier to cite or link to this item:
|Title:||Surveillance and calibration of standard resistors at a Metrological laboratory|
|Abstract:||The paper presents a metrological technique for surveillance and calibration of similar standard resistors taken in group, at laboratories ranked next to the national level laboratories, based on calculation of eigen values and eigen vector of the measurement data matrix. The technique employs the various cross-products of measurement ratio data and provides a new mean of group calibration.|
|ISSN:||0975-1017 (Online); 0971-4588 (Print)|
|Appears in Collections:||IJEMS Vol.02(6) [December 1995]|
Items in NOPR are protected by copyright, with all rights reserved, unless otherwise indicated.