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dc.contributor.authorQuamara, J K-
dc.contributor.authorSingh, N-
dc.contributor.authorSingh, Azad-
dc.identifier.issn0975-1041 (Online); 0019-5596 (Print)-
dc.description.abstractTemperature and frequency dependent dielectric behaviour has been investigated for pristine and high temperature annealed poly p-phenylene sulphide (PPS) in the temperature range 30 to 250 °C at frequencies 120 Hz,1, 10 and 100 kHz. Samples used were in the form of pellets. A continuous decrease in dielectric constant from 30 to 140 °C is according to Kirkwood model. A dipolar relaxation process (β'-relaxation) associated with the newly formed cross-linked structure due to annealing and rigid amorphous phase (RAP) dipolar relaxation (δ-relaxation) have been held responsible to dominate the dielectric behaviour in the temperature region 140 to 190 °C and making ε' temperature independent in this temperature region. A dielectric loss maxima observed between 140 to 160 °C confirms β'-relaxation. Above 190 °C, the crystalline amorphous region with RAP as interface material leading to interfacial polarization (α-relaxation) has been held responsible for increasing the ε' value with temperature. The α-relaxation is confirmed through a dielectric loss peak in ε"-T curve around 230 °C. The frequency dependent nature of the α-loss peak shows its distributive nature in relaxation time. A decrease in the α- and β'-loss peak magnitudes in high temperature annealed samples is due to increase in crystallinity.en_US
dc.publisherNISCAIR-CSIR, Indiaen_US
dc.rights CC Attribution-Noncommercial-No Derivative Works 2.5 Indiaen_US
dc.sourceIJPAP Vol.40(06) [June 2002]en_US
dc.titleTemperature and frequency dependent dielectric constant/loss studies in pristine and high temperature annealed poly (p-phenylene sulphide)en_US
Appears in Collections:IJPAP Vol.40(06) [June 2002]

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