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Title: Conduction mechanism in CuxFe3-xO4
Authors: Patil, A N
Mahajan, R P
Patankar, K K
Ghatage, A K
Mathe, V L
Patil, S A
Issue Date: Sep-2000
Publisher: NISCAIR-CSIR, India
Abstract: The electrical resistivity and thermoelectric power measurements as a function of temperature are carried out for the system CuxFe3-xO4 with x = 1, 0.8, 0.6, 0.4 and 0.2. The lattice constants of the phases are evaluated from X- ray powder data. The thermoelectric powder measurement indicates that the samples are n-type semiconductor and the conduction mechanism is associated with the polaron hopping. The dielectric behaviour is found to be abnormal and this is explained on the basis of Koop's model.
Page(s): 651-656
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Appears in Collections:IJPAP Vol.38(09) [September 2000]

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