Please use this identifier to cite or link to this item: http://nopr.niscair.res.in/handle/123456789/25145
Title: Preparation and characterization of nano scale PMMA thin films
Authors: Sathish, S
Shekar, B Chandar
Keywords: PMMA;Fast dip coating technique;Morphology;Mesoscopic;FTIR;XRD;SEM;Thin film;Characterization
Issue Date: Jan-2014
Publisher: NISCAIR-CSIR, India
Abstract: Thin films of nano scale poly (methyl methacrylate) (PMMA) were prepared by fast dip coating technique (FDCT). XRD spectra indicated the amorphous nature of the films. The closer SEM inspection revealed that self-assembled mesoscopic cells for both as grown and annealed PMMA films. Low leakage current was observed in the J-V characteristics for the voltage ranges studied. The absence of hysteresis in the J-V characteristics for the forward and reverse sweep direction eliminates the presence of deep traps in the PMMA thin films studied. The observed surface morphology, thermal stability and J-V behaviour indicated that these films could be used as AFM data storage devices as an efficient dielectric layer in field effect organic thin film transistors.
Page(s): 64-67
URI: http://hdl.handle.net/123456789/25145
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Appears in Collections:IJPAP Vol.52(01) [January 2014]

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