Please use this identifier to cite or link to this item: http://nopr.niscair.res.in/handle/123456789/25041
Title: Optical properties of SnTexSe1-x thin films
Authors: Soliman, L I
Farag, B S
Zayed, H A
Shehata, F M
Issue Date: Feb-2003
Publisher: NISCAIR-CSIR, India
Abstract: Ternary alloys of SnTexSe1-x (0≤ x≤1) were synthesized by direct fusion method. The SnTexSe1-x films were prepared by thermal evaporation under vacuum of about 10-5 torr and with evaporation rate of about 30 nm/min. X-ray diffraction and microprobe analysis technique, investigated the structural and the composition analysis of SnTexSe1-x in powder and thin film forms, respectively. X-ray diffraction patterns of the as-deposited and the annealed films of this system reveal that , these have polycrystalline nature of orthorhombic structure for allays with compositions x = 0, 0.2, and 0.4 and cubic structure for alloys with compositions x = 0.6, 0.8 and 1. The variation of lattice parameters with different compositions x were also determined. The optical constants (the refractive index n, the absorption index k, the absorption coefficient α, the dielectric constants Ɛ1 and Ɛ2) of SnTexSe1-x, films were determined for different thickness in the spectral range 500-2500 nm. The optical absorption results indicate that, the fundamental absorption edge for SnTexSe1-x, (0≤ x≤0.6) films is due to an allowed, direct and indirect transition energy gaps and only direct energy gap for 0.80≤ x≤1. It was round that the optical energy gaps for annealed films decreased as compared with the as-deposited films. This decrease of the energy gaps is attributed to the change in the structure of the films from amorphous to crystalline. The variations of the optical constants (n, k, Ɛ1 and Ɛ2) with composition were investigated.
Page(s): 131-138
URI: http://hdl.handle.net/123456789/25041
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Appears in Collections:IJPAP Vol.41(02) [February 2003]

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