Please use this identifier to cite or link to this item: http://nopr.niscair.res.in/handle/123456789/24369
Title: X-ray diffraction studies of Ga2Te3
Authors: Singh, D P
Khan, M Y
Issue Date: Feb-2001
Publisher: NISCAIR-CSIR, India
Abstract: Compound Ga2Te3 was prepared from the melt of initial elements of purity > 99.999% and characterized by powder and single crystal techniques of X-ray diffraction analysis. Powder X-ray pattern was obtained up to sin θ/λ =0.634Å-1 and indexed. The powder data were corrected and explained on the findings of single crystal, obtained from the polycrystalline ingot. The studies revealed that it crystallized in the cubic form of zinc blende structure with ao=5.8984A, Z= 1.333, space group F43m and Dx=5.668 g/cc. Single crystals exhibited the property of cleavage along < 11> and twinning a long < 10 > directions.
Page(s): 46-49
URI: http://hdl.handle.net/123456789/24369
ISSN: 0975-1017 (Online); 0971-4588 (Print)
Appears in Collections:IJEMS Vol.08(1) [February 2001]

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