Please use this identifier to cite or link to this item: http://nopr.niscair.res.in/handle/123456789/2337
Title: Measurement and simulation of carbon nanotube’s piezoresistance property by a micro/nano combined structure
Authors: Yang, Xing
Zhou, Zhaoying
Wu, Ying
Xiao, Mingfei
Luo, Qingqing
Shao, Chenren
Keywords: Piezoresistance
Carbon nanotube
Micro/nano combined device
Issue Date: Apr-2007
Publisher: CSIR
Series/Report no.: B82B; H01L41/00
Abstract: In this paper, the present status of carbon nanotube’s electromechanical properties was reviewed. The relationships among the carbon nanotube’s resistance, gauge factor and the rates of change of the band gaps with strain (dEℊ/dƐ) were analyzed and simulated. Then, a micro/nano combined device and method for measuring the piezoresistance property of carbon nanotube were proposed. The device is consisted of a silicon chip and a printed circuit board which is used for loading and leading wire. The microelectrodes were fabricated on the silicon chip by FIB and a CVD-growth single-wall carbon nanotube was connected with the microelectrodes. The voltage-current characteristic of the carbon nanotube was measured using the proposed device. The relationship between the current and the voltage is basically linear, which demonstrates that the carbon nanotube is metallic. The experimental results show that the micro/nano combined device can be used for measuring the piezoresistance of carbon nanotube in our future work.
Description: 282-286
URI: http://hdl.handle.net/123456789/2337
ISSN: 0019-5596
Appears in Collections:IJPAP Vol.45(04) [April 2007]

Files in This Item:
File Description SizeFormat 
IJPAP 45(4) 282-286.pdf590 kBAdobe PDFView/Open


Items in NOPR are protected by copyright, with all rights reserved, unless otherwise indicated.