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Title: Application of proton induced X-ray emission (PIXE) in estimation of trace metals entrapped in silica matrix
Authors: Jal, P K
Sudarshan, M
Saha, A
Patel, Sabita
Mishra, B K
Issue Date: Jul-2005
Publisher: NISCAIR-CSIR, India
IPC Code: Int. Cl.7 G01N21/00
Abstract: Pro ton induced X-ray emission technique is used for multielemental analysis of metal ions adsorbed on nallosilica surface. At pH 3.5, silica traps uranium selectively from a mixture of solutions of 13 different metal ions viz., K (I), Ca(II), Fe(III), Mn(II), Co(II), Ni(II), Cu(II), Zn(II ), Sr(II), Cd(II). Ba(II), Hg(II) and UO2(VI).
Page(s): 1378-1382
ISSN: 0975-0975(Online); 0376-4710(Print)
Appears in Collections:IJC-A Vol.44A(07) [July 2005]

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