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IJPAP Vol.50(11) [November 2012] >


Title: Utilization of 10 MeV RF electron linear accelerator for research and industrial applications
Authors: Kumar, M
Chaudhury, N
Bhattacharjee, D
Yadav, V
Ghodke, S R
Baranwal, R
Mondal, J
Tiwary, R R
Chandan, S
Tillu, A R
Sharma, V
Chavan, R B
Jayaprakash, D
Mishra, R L
Kumar, Mahendra
Patel, R
Nayak, B
Dixit, K P
Acharya, S
Nimje, V T
Mittal, K C
Chakravarthy, D P
Gantayet, L M
Keywords: Printed circuit board
Alanine-EPR
Radio-chromic film
Spectrophotometer
Linac
Issue Date: Nov-2012
Publisher: NISCAIR-CSIR, India
Abstract: A 10MeV RF electron linear accelerator (Linac) is regularly used at Electron Beam Centre (EBC) Kharghar, BARC to demonstrate the radiation processing of different research and industrial applications. The use of 10 MeV electron beam for environment friendly waste disposal of printed circuit board (PCB) has been demonstrated. The 99.9% pure Cu foil has been extracted from the PCB by imparting 300 kGy of radiation dose. The power diode of Bharat Heavy Electricals Limited (BHEL) has been irradiated by imparting a dose of 4 kGy to achieve reduction in reverse recovery time (Trr) from 15 µs to 6 µs. An irradiation experiment of polymer blend samples has been conducted by RTDD, BARC at EBC to increase the tensile strength of blends of low density polyethylene (LDPE) and ethylene vinyl acetate (EVA) from 6 MPa to 7.8 MPa by imparting a dose of 100 kGy. The alanine-EPR dosimetry has been done to optimize process parameters for food irradiation. The semolina (cream of wheat) packets are irradiated at the Dmin (minimum dose level) of 250 Gy and Dmax (maximum dose level) of 1 kGy. The dose between the Dmin and Dmax has been delivered using 10 MeV electron beam, and packets are kept to collect further data. Various research experiments of BARC and other universities have been carried out to study the effects of irradiation on materials.
Page(s): 802-804
CC License:  CC Attribution-Noncommercial-No Derivative Works 2.5 India
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Source:IJPAP Vol.50(11) [November 2012]

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