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IJPAP Vol.50(09) [September 2012] >


Title: Measurement of microstructure in micro electro mechanical systems using optical interferometric microscope
Authors: Lin, Chern-Sheng
Fu, Shu-Hsien
Yeh, Mau-Shiun
Tsou, Chingfu
Lai, Teng-Hsien
Keywords: Micro electro mechanical element
Optical interferometric microscope
Interference fringe
Issue Date: Sep-2012
Publisher: NISCAIR-CSIR, India
Abstract: An automatic measurement system for micro electro mechanical element with optical interferometric microscope is presented in the paper. The system introduces a novel method to calculate the central dark fringe (intensity minimum) and central bright fringe (intensity maximum) in the image. The changing of height in asymmetric micro-structure, based on the phase definition of interference fringe can be calculated. Interferometric image information is derived through image processing method, and innovated contour line algorithm is used to build up micro-structure 3D profile. In the experiments, the total processing time for five parts of element could be reduced to less than 5 s and the system error is less than 0.02 μm.
Page(s): 641-649
CC License:  CC Attribution-Noncommercial-No Derivative Works 2.5 India
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Source:IJPAP Vol.50(09) [September 2012]

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