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IJPAP Vol.50(07) [July 2012] >


Title: Low energy pulsed X-ray ion chamber monitor for accelerator safety
Authors: Dighe, P M
Kamble, L P
Das, D
Pithawa, C K
Keywords: Ion Chamber
Pulsed X-ray
Electron accelerator
Area monitoring
Issue Date: Jul-2012
Publisher: NISCAIR-CSIR, India
Abstract: Ion chamber sensitive to low energy pulsed X-rays has been developed for area monitoring at the electron accelerators Indus 1 and 2 of Raja Ramanna Centre for Advanced Technology, Indore. Conventional monitors available commercially underestimate the X-ray background because of pulsed nature of the radiation and are not sensitive to X-rays below 100 keV. For this purpose, a high pressure ion chamber made of aluminium with all welded construction has been developed and tested for use in pulsed X-ray background. The chamber has 25 litre sensitive volume, filled with nitrogen at 85 psi and current sensitivity is 12 nA/R/h. The chamber can measure exposure levels from 20 mR/h to 100 mR/h and has uniform energy response within ±12% from 35 keV to 1.25 MeV of X-ray energy. The ion chamber gave more than 86% collection efficiency at 100 mR/h average pulsed X-ray background for 500 V operating voltage. Theoretically evaluated collection efficiency values closely match with the experimentally observed values. The design details and characterisation of the ion chamber under different X-ray energy exposures and collection efficiency estimation for pulsed X-ray background have been studied.
Page(s): 458-461
CC License:  CC Attribution-Noncommercial-No Derivative Works 2.5 India
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Source:IJPAP Vol.50(07) [July 2012]

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