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Journal of Scientific and Industrial Research (JSIR) >
JSIR Vol.71 [2012] >
JSIR Vol.71(05) [May 2012] >
| Title: | A comparison of lifted lead defect inspection system for surface mount technology |
| Authors: | Ramli, Rizauddin
Wahab, Dzuraidah Abd
Ghani, Jaharah Abd
Zain, Raime M |
| Keywords: | Lifted lead defect
Surface mount technology (SMT)
Vision camera |
| Issue Date: | May-2012 |
| Publisher: | NISCAIR-CSIR, India |
| Abstract: | This study presents development of an automated lead
defect inspection system by using Visual Mechanical Inspection Scanner (VMIS)
in semiconductor industry. In any device seated out of cavity, VMIS detects
misplacement error (ME), a quality defect in surface mount technology (SMT). ME
causes a lifted lead defect on lead packages. MEs that can be analyzed are of
two kinds: i) device seated out of cavity; and ii) double devices imbedded in
the same cavity. The system was successfully tested on devices with 90%
accuracy of inspection. Thus VMIS can inspect device seated out of cavity and
hence prevents lifted lead from occurring. |
| Page(s): | 330-333 |
| CC License: |  CC Attribution-Noncommercial-No Derivative Works 2.5 India |
| ISSN: | 0975-1084 (Online); 0022-4456 (Print) |
| Source: | JSIR Vol.71(05) [May 2012]
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