NISCAIR Online Periodicals Repository

Research Journals >
Journal of Scientific and Industrial Research (JSIR) >
JSIR Vol.67 [2008] >
JSIR Vol.67(06) [June 2008] >

Title: Wavelet-based neural network and statistical approaches applied to automated visual inspection of LED chips
Authors: Lin, Hong-Dar
Lin, Gary C
Chung, Chung-Yu
Lin, Wan-Ting
Keywords: Automated visual inspection
Back-propagation network
Hotelling statistic
LED chip production
Wavelet characteristics
Issue Date: Jun-2008
Publisher: CSIR
Abstract: This research explores automated visual inspection of surface defects in a light-emitting diode (LED) chip. One-level Haar wavelet transform is first used to decompose a chip image and extract four wavelet characteristics. Then, wavelet-based back-propagation network (WBPN) and wavelet-based Hotelling statistic (WHS) approaches are respectively applied to integrate multiple wavelet characteristics. Finally, back-propagation algorithm of WBPN or Hotelling test of WHS judges existence of defects. Two proposed methods achieve detection rates of above 90.8% and 92.4%, and false alarm rates below 4.4% and 6.1%, respectively. A valid computer-aided visual defect inspection system is contributed to help meet quality control needs of LED chip manufacturers.
Page(s): 412-420
ISSN: 0022-4456
Source: JSIR Vol.67(06) [June 2008]

Files in This Item:

File Description SizeFormat
JSIR 67(6) (2008) 412-420.pdf238.92 kBAdobe PDFView/Open
 Current Page Visits: 136 
Recommend this item


Online Submission of Articles |  NISCAIR Website |  National Knowledge Resources Consortium |  Contact us |  Feedback

Disclaimer: NISCAIR assumes no responsibility for the statements and opinions advanced by contributors. The editorial staff in its work of examining papers received for publication is helped, in an honorary capacity, by many distinguished engineers and scientists.

CC License Except where otherwise noted, the Articles on this site are licensed under Creative Commons License: CC Attribution-Noncommercial-No Derivative Works 2.5 India

Copyright © 2015 The Council of Scientific and Industrial Research, New Delhi. All rights reserved.

Powered by DSpace Copyright © 2002-2007 MIT and Hewlett-Packard | Compliant to OAI-PMH V 2.0

Home Page Total Visits: 162359 since 01-Sep-2015  Last updated on 21-Jun-2016Webmaster: