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Title: Postharvest Technology
Issue Date: Oct-2011
Publisher: NISCAIR-CSIR, India
Abstract: The effects of freezing process and frozen storage at isothermal (−7, −15 and −25 C) and nonisothermal (accelerated life testing with step-stressmethodology; temperature range from −30 to −5 °C) conditions on pumpkin quality were investigated.
Page(s): 224
Appears in Collections:NPARR Vol.2(4) [October 2011]

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