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Indian Journal of Pure & Applied Physics (IJPAP) >
IJPAP Vol.50 [2012] >
IJPAP Vol.50(02) [February 2012] >
| Title: | Structural, electrical and optical characterization of CuInS2 thin films deposited by spray pyrolysis |
| Authors: | Hussain, K M A
Podder, J
Saha, D K
Ichimura, M |
| Keywords: | Spray Pyrolysis
Copper Indium Disulphide
X-ray Diffraction
Band Gap |
| Issue Date: | Feb-2012 |
| Publisher: | NISCAIR-CSIR, India |
| Abstract: | Copper indium disulphide (CuInS2) thin films have been deposited
on glass substrates by varying Cu:In and S:Cu ratios using spray pyrolysis
deposition. The structural, compositional and electrical characterizations of
the thin films have been analyzed by Energy Dispersive X-ray Analysis (EDAX),
Scanning Electron Microscopy (SEM), X-ray diffraction (XRD), dc conductivity
measurement and UV-VIS-NIR Spectrophotometry. The surface morphology has beenn
studied by SEM. From XRD spectrum, the fundamental peaks of CuInS2 (CIS) thin
films have been identified as (112), (004)/(200), (204)/(220), (116)/(312) and (224) which indicate the
chalcopyrite structure and showed
an improvement of crystallinity
of CuInS2
thin films for Cu:In:S
ratio of 1.14:1:1.88. The temperature variation of dc conductivity
showed its semiconducting nature in all the films and the highest conductivity
was estimated as 11.1786 ( -cm)-1 and
the corresponding band gap of 1.48eV. |
| Page(s): | 117-122 |
| CC License: |  CC Attribution-Noncommercial-No Derivative Works 2.5 India |
| ISSN: | 0975-1041 (Online); 0019-5596 (Print) |
| Source: | IJPAP Vol.50(02) [February 2012]
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