Please use this identifier to cite or link to this item: http://nopr.niscair.res.in/handle/123456789/1331
Title: Achieving yield construction and process analysis in TFT-LCD industry based on critical layers and areas
Authors: Hsieh, K-L
Keywords: Backpropagation neural network model
Critical areas
Critical layers
Liquid crystal displays (LCDs)
Stepwise regression technique
Issue Date: Nov-2007
Publisher: CSIR
Abstract: In this study, a procedure is proposed to address achieving yield construction and process analysis in TFT-LCD industry based on critical layers and areas. Besides, an illustrative case owing to TFT-LCD manufacturer at Tainan Science Park in Taiwan has been applied to verify rationality and feasibility of proposed procedure.
Description: 891-897
URI: http://hdl.handle.net/123456789/1331
ISSN: 0022-4456
Appears in Collections:JSIR Vol.66(11) [November 2007]

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