|
NISCAIR ONLINE PERIODICALS REPOSITORY (NOPR) >
NISCAIR PUBLICATIONS >
Research Journals >
Journal of Scientific and Industrial Research (JSIR) >
JSIR Vol.66 [2007] >
JSIR Vol.66(11) [November 2007] >
| Title: | Achieving yield construction and process analysis in TFT-LCD industry based on critical layers and areas |
| Authors: | Hsieh, K-L |
| Keywords: | Backpropagation neural network model
Critical areas
Critical layers
Liquid crystal displays (LCDs)
Stepwise regression technique |
| Issue Date: | Nov-2007 |
| Publisher: | CSIR |
| Abstract: | In this study, a procedure is proposed to address achieving yield construction and process analysis in TFT-LCD industry
based on critical layers and areas. Besides, an illustrative case owing to TFT-LCD manufacturer at Tainan Science Park in
Taiwan has been applied to verify rationality and feasibility of proposed procedure. |
| Page(s): | 891-897 |
| ISSN: | 0022-4456 |
| Source: | JSIR Vol.66(11) [November 2007]
|
|
