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|Title:||Achieving yield construction and process analysis in TFT-LCD industry based on critical layers and areas|
|Keywords:||Backpropagation neural network model;Critical areas;Critical layers;Liquid crystal displays (LCDs);Stepwise regression technique|
|Abstract:||In this study, a procedure is proposed to address achieving yield construction and process analysis in TFT-LCD industry based on critical layers and areas. Besides, an illustrative case owing to TFT-LCD manufacturer at Tainan Science Park in Taiwan has been applied to verify rationality and feasibility of proposed procedure.|
|Appears in Collections:||JSIR Vol.66(11) [November 2007]|
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|JSIR 66(11) (2007) 891-897.pdf||93.64 kB||Adobe PDF||View/Open|
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